X-ray or gamma ray systems or devices – Beam control – Window
Patent
1990-05-16
1991-09-17
Westin, Edward P.
X-ray or gamma ray systems or devices
Beam control
Window
378203, 378204, 378210, 242 673R, G21K 100, H01J 3516, H05G 100
Patent
active
050502018
ABSTRACT:
An apparatus provided with a measuring head for determining with the aid of X-ray fluorescence or X-ray absorption measuring techniques the surface weight of a measuring subject comprising coatings or surface-deposits or the concentration of basic substances in the subject to be measured, comprising liquid, slurries, powder or solid samples. The apparatus includes means for moving the measuring head (1) over the subject (5) to be measured and also over a reference sample (4), such as a sample or an empty sample-container, or vice versa. The measuring aperture provided in the measuring head (1) is covered with a protective film (7) for the purpose of preventing the ingress of particles from the subject (5) into the aperture. Means (3) are also provided for checking the dirt-coating on the protective film (7) regularly and for sending an order to a film-carrying device (8, 10, 11) to advance film when the dirt-coating is found unacceptable.
REFERENCES:
patent: 3510648 (1970-05-01), Leger, Jr.
patent: 3848133 (1974-11-01), Blanc et al.
patent: 4104528 (1978-08-01), Strax
Baecklund Johannes
Borjesson Lars
Refina Instrument AB
Westin Edward P.
Wong Don
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