Thermal measuring and testing – Thermal calibration system
Patent
1999-06-25
2000-08-22
Gutierrez, Diego
Thermal measuring and testing
Thermal calibration system
374141, 392416, 219390, 427521, 427557, 438796, G01K 1500, H01L 2102, F27D 1100
Patent
active
061061484
ABSTRACT:
This invention presents an automatic calibration system and method for calibration of a substrate temperature sensor in a thermal processing equipment, such as a rapid thermal processing system. The calibration system includes a temperature-sensitive probe associated with the substrate temperature sensor to calibrate the substrate temperature sensor and an actuator to position the temperature-sensitive probe relative to the substrate during a calibration cycle. The actuator and temperature-sensitive probe of the automatic calibration system can be incorporated into the thermal processing equipment in order to maintain the thermal processing equipment cleanliness and integrity during a calibration cycle, and to allow rapid automated calibration. In the preferred embodiment of this invention, the temperature-sensitive probe and its actuator are implemented in the gas showerhead assembly of a rapid thermal processing system.
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Lee Yong Jin
Moslehi Mehrdad M.
CVC, Inc.
Gutierrez Diego
Pruchnic Jr. Stanley J.
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