Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1995-09-19
1998-07-28
Nguyen, Vinh P.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324765, G01R 3126
Patent
active
057866899
ABSTRACT:
An apparatus for measuring an electrical characteristic of a semiconductor device, particularly for determining the dependence of leakage current of the semiconductor device with time or after a stress is applied to the semiconductor device. An accumulator counts pulses of an internal clock thereby separately determining the time during which a stress is applied and the time during which a measurement is made. These two times are recorded with the measured characteristic, such as leakage current. The measured characteristic is plotted on the basis of the duration of the applied stress and duration of the measurement and displayed.
REFERENCES:
patent: 5349290 (1994-09-01), Yamada
patent: 5519327 (1996-05-01), Consiglio
patent: 5600578 (1997-02-01), Fang et al.
Keithley, "Test & Measurement 1993-1994 Catalogue and Reference Guide"; pp. 80-85. (Month Unavailable).
Hewlett Packard, "Semiconductor Parameter Analyzer" and Precision Semiconductor Parameter Analyzer; Technical Data, pp. 1-9, Oct. 1993. (English Translation attached).
Kobert Russell M.
Mitsubishi Denki & Kabushiki Kaisha
Nguyen Vinh P.
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