Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-11-15
2005-11-15
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S117000, C324S525000, C324S600000, C324S762010
Reexamination Certificate
active
06965838
ABSTRACT:
A computing system includes a semiconductor which sources current to load components within the system, a controllable load coupled to the semiconductor and having an on-state in which a predetermined current load is drawn from the semiconductor in addition to the load components, and a controller which couples the semiconductor and the controllable load. In this configuration, the controller senses the voltage across the semiconductor on at least three points in time. The controller activates the on-state of the controllable load during one of the three points in time and derives a first calculated voltage as a function of the three voltages sensed. The controller calculates the on-resistance of the semiconductor by dividing the first calculated voltage by the predetermined current.
REFERENCES:
patent: 6642738 (2003-11-01), Elbanhawy
patent: 2004/0148123 (2004-07-01), Abe
patent: 07202219 (1995-08-01), None
patent: 08068824 (1996-03-01), None
patent: 11204609 (1999-07-01), None
Barbee Manuel L
Ray-Yarletts Jeanine S.
Wachsman Hal
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