Apparatus having a pivoted eddy current probe for detecting flaw

Details Apparatus having a pivoted eddy current probe for detecting flaw Apparatus having a pivoted eddy current probe for detecting flaw

1994-06-27

1996-01-02

Williams, Hezron E.

Measuring and testing

Probe or probe mounting

324220, G01D 2100

Patent

active

054798345

ABSTRACT:
An apparatus for inspecting the inner surface (8a) of a hole includes a rotor shaft (12) supported rotatably (14, 16) around its lengthwise axis and movably along the axis and a sensor assembly (7) which is linked by a tilting mechanism (1) with the rotor shaft so that it can be inclined with respect to the axis of the rotor shaft and rotates and moves as the rotor shaft rotates and moves. The sensor assembly selectively assumes the upright position in which its axis coaligns with the lengthwise axis of the rotor shaft, which is necessary for inserting the sensor assembly through a hole (9a) into the hole in the object being inspected, and a titled position in which its axis is inclined with respect to the axis of the rotor shaft, which is necessary for scanning the inner surface (8c) of the hole, by tilting mechanism (1). The rotor shaft is connected to a rotating mechanism (3) and a lifting mechanism (2).

REFERENCES:
patent: 3279079 (1966-10-01), Schiler
patent: 3718855 (1973-02-01), Rogel et al.
patent: 3780571 (1973-12-01), Wiesener
patent: 3823482 (1974-07-01), Schiler
patent: 3862578 (1975-01-01), Schluter
patent: 4139822 (1979-02-01), Urich et al.
patent: 4441078 (1978-04-01), Lecomte
patent: 5025215 (1991-06-01), Pirl

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