Apparatus for x-ray fluoresence analysis

Details Apparatus for x-ray fluoresence analysis Apparatus for x-ray fluoresence analysis

1980-06-19

1982-05-25

Smith, Alfred E.

Radiant energy

Ionic separation or analysis

With sample supply means

G01N 2320

Patent

active

043318703

ABSTRACT:
In apparatus for x-ray fluorescence analysis in which x-ray fluorescence radiation is excited in a specimen, in order to obtain simultaneous coverage of fluorescence radiation of different wavelengths even from inhomogeneous specimens, the source for the radiation to be analyzed is made point shaped or line shaped, the source is located at the focus of a parabolically curved analyzer crystal, the lattice planes of which are parallel to its surface, and a position sensitive detector is arranged with its axis perpendicular to the parabola axis of the parabolic analyzer crystal, opposite the analyzer crystal.

REFERENCES:
patent: 3079501 (1963-02-01), Birks, Jr.
patent: 3663812 (1972-05-01), Koenig et al.
patent: 4131794 (1978-12-01), Bruninx

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