Optics: measuring and testing – By light interference – Having polarization
Reexamination Certificate
2005-11-01
2010-10-26
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By light interference
Having polarization
C356S237200
Reexamination Certificate
active
07821644
ABSTRACT:
An apparatus is provided which reduces the dependency of the direction of polarization on channels of an image sensor so as to improve the sensitivity of inspection. In the apparatus, the direction of an illumination beam incident on a polarizing beam splitter is made to be substantially parallel to the longitudinal direction of a field of view of an image sensor projected on the polarizing beam splitter.
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Japanese Office Action, w/ English translation thereof, issued in Japanese Patent Application No. JP 2004-320771 drafted Nov. 16, 2009.
Kamei Mitsuhiro
Shimura Kei
Chowdhury Tarifur
Hansen Jonathan M
Hitachi High-Technologies Corporation
McDermott Will & Emery LLP
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