Apparatus for treating substrate

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With gas inlet structure

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C156S345210, C156S345390, C156S345420

Reexamination Certificate

active

07323080

ABSTRACT:
The present is directed to an apparatus for etching the top edge and bottom of a wafer. The apparatus includes a substrate support part for supporting a wafer and a movable protect part for preventing fluid for an etch from flowing into a non-etch portion of the wafer. The top edge and bottom of the wafer is etched by a wet etch, and a boundary of the non-etch portion and the edge of the wafer is etched by a dry etch.

REFERENCES:
patent: 5945351 (1999-08-01), Mathuni
patent: 6280645 (2001-08-01), Yanagisawa et al.
patent: 6406589 (2002-06-01), Yanagisawa
patent: 6939807 (2005-09-01), Yun et al.
patent: 6989228 (2006-01-01), Kojima et al.
patent: 2002/0023896 (2002-02-01), Tachino et al.
patent: 2005/0247667 (2005-11-01), Kim et al.
patent: 1492485 (2004-04-01), None
patent: 6-251894 (1994-09-01), None
patent: 07-142449 (1995-06-01), None
patent: 7-142449 (1995-06-01), None
patent: 7-211491 (1995-08-01), None
patent: 7-245192 (1995-09-01), None
patent: 11-54479 (1999-02-01), None
patent: 11-260597 (1999-09-01), None
patent: 13-156039 (2001-08-01), None
patent: 2002-124501 (2002-04-01), None
patent: 2003-264168 (2003-09-01), None
patent: 2000-0052534 (2000-08-01), None
patent: 2002-0009248 (2002-02-01), None
patent: 10-0346524 (2002-07-01), None
patent: 10-0034856 (2004-04-01), None
patent: 10-2004-0075125 (2004-08-01), None
patent: 10-2004-0088507 (2004-10-01), None
patent: 2004-88507 (2004-10-01), None
patent: WO 02/01617 (2002-01-01), None
Korean Patent Office Communication dated Oct. 31, 2005 (with English translation) for Application No. KR 10-2004-0031368.
Korean Patent Office Communication dated Oct. 31, 2005 (with English translation) for Application No. KR 10-2004-0031369.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus for treating substrate does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for treating substrate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for treating substrate will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2808566

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.