Image analysis – Applications – Manufacturing or product inspection
Patent
1999-05-28
2000-05-16
Mehta, Bhavesh
Image analysis
Applications
Manufacturing or product inspection
25055923, 25055931, 348 87, 348 94, 356376, 382151, 382154, 702152, G06K 900
Patent
active
060647566
ABSTRACT:
A three dimensional inspection apparatus for ball array devices, where the ball array device is positioned in a fixed optical system. An illumination apparatus is positioned for illuminating the ball array device. A first camera is disposed in a fixed focus position relative to the ball array device for taking a first image of the ball array device to obtain a characteristic circular doughnut shape image from a ball. A second camera is disposed in a fixed focus position relative to the ball array device for taking a second image of the ball array device to obtain a top surface image of the ball. A processor applies triangulation calculations on related measurements of the first image and the second image to calculate a three dimensional position of the ball with reference to a pre-calculated calibration plane.
REFERENCES:
patent: 4521807 (1985-06-01), Werson
patent: 4677473 (1987-06-01), Okamoto et al.
patent: 4731855 (1988-03-01), Suda et al.
patent: 5058178 (1991-10-01), Ray
patent: 5245671 (1993-09-01), Kobayashi et al.
patent: 5355221 (1994-10-01), Cohen et al.
patent: 5420689 (1995-05-01), Siu
patent: 5465152 (1995-11-01), Bilodeau et al.
patent: 5546189 (1996-08-01), Svetkoff et al.
patent: 5574668 (1996-11-01), Beaty
patent: 5574801 (1996-11-01), Collet-Beillon
patent: 5581632 (1996-12-01), Koljonen et al.
patent: 5592562 (1997-01-01), Rooks
patent: 5600150 (1997-02-01), Stern et al.
patent: 5617209 (1997-04-01), Svetkoff et al.
patent: 5621530 (1997-04-01), Marrable, Jr.
patent: 5648853 (1997-07-01), Stern et al.
patent: 5652658 (1997-07-01), Jackson et al.
patent: 5654800 (1997-08-01), Svetkoff et al.
patent: 5734475 (1998-03-01), Pai
patent: 5801966 (1998-09-01), Ohashi
patent: 5812268 (1998-09-01), Jackson et al.
patent: 5812269 (1998-09-01), Svetkoff et al.
patent: 5815275 (1998-09-01), Svetkoff et al.
patent: 5818061 (1998-10-01), Stern et al.
patent: 5828449 (1998-10-01), King et al.
patent: 5859698 (1999-07-01), Chau et al.
patent: 5859924 (1999-07-01), Liu et al.
patent: 5870489 (1999-02-01), Yamazaki et al.
patent: 5926557 (1999-07-01), King et al.
patent: 5943125 (1999-08-01), King et al.
ICOS Vision Systems Product literature on BGA 3D InspectionSystem.
Beaty Elwin M.
Mork David P.
Beaty Elwin M.
Leone George A.
Mehta Bhavesh
LandOfFree
Apparatus for three dimensional inspection of electronic compone does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus for three dimensional inspection of electronic compone, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for three dimensional inspection of electronic compone will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-265735