Apparatus for the non-destructive examination of heterogeneous s

Details Apparatus for the non-destructive examination of heterogeneous s Apparatus for the non-destructive examination of heterogeneous s

1974-12-02

1977-06-21

McGraw, Vincent P.

Optics: measuring and testing

Oil testing

356 85, G01J 344

Patent

active

040308278

ABSTRACT:
The present invention relates to an apparatus for the non-destructive examination of an heterogeneous sample by analysis of the Raman radiations scattered by the sample receiving an incident of monochromatic radiation of known frequency. The apparatus includes a source of monochromatic light, such as a laser beam, a monochromator for selecting and measuring the change in frequency of the Raman scattered or re-emitted radiations with respect to the frequency of the incident radiation, a radiation detector and an amplifier to amplify signals from the detector. The apparatus identifies each such re-emitted radiation by comparison with control samples or reference spectra. The invention enables selective mapping of the distribution of the polyatomic ions, crystals and molecules of the sample. Apparatus embodying the invention permits mapping, by micrographic images, of the components of geological samples, composite materials, plastic materials, biological samples, microscopic preparations and the like, by isolating in the Raman spectrum the radiations characterizing the components.

REFERENCES:
patent: 3802777 (1974-04-01), Regnier et al.
patent: 3832558 (1974-08-01), Fern et al.
"Analytical . . . Chemical Processes," Fowler et al., IBM Tech. Disc. Bulin, vol. 15, No. 12, May, 1973, pp. 3885-3886.
"Raman . . Insolid State Physics," Shepherd, Applied Optics, vol. 11, No. 9, Sept., 1972, pp. 1924-1927.

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