Single-crystal – oriented-crystal – and epitaxy growth processes; – Apparatus
Patent
1996-08-27
1999-04-06
Hiteshew, Felisa
Single-crystal, oriented-crystal, and epitaxy growth processes;
Apparatus
117 2, 117 3, 117 4, 117 9, 117 43, C30B 3500
Patent
active
058912444
ABSTRACT:
The present invention provides a process for preparing SOI wafer, more specifically, a process for preparing a large-sized SOI wafer of high quality of crystallization employing an apparatus for the manufacture of the SOI wafer in a simple and efficient manner. The apparatus for the manufacture of SOI wafer of the invention comprises electric furnace for heating polycrystalline silicon filled in a heat-resistant container; means for moving up and down of an insulating substrate whose one side is accompanied with silicon single crystalline seed, and immersing the substrate in the molten silicon filled in the heat-resistant container to form a thin single crystalline film on the substrate; and, shapers to keep a constant thickness of the thin single crystalline film which is formed on the insulating substrate by the moving means. Further, a process for preparing SOI wafer of the invention comprises the steps of: preparing a molten silicon by heating polycrystalline silicon; growing a thin single crystalline film by moving down one or more insulating substrate whose one side is accompanied with the silicon single crystalline seed to immerse the seed in the molten silicon, and moving up one or more insulating substrates to solidify the silicon deposited on the substrates; and, keeping a constant thickness of the thin single crystalline film which is formed on the insulating substrate employing a shaper.
REFERENCES:
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H.W. Lam,, Simox SOI for Integrated Circuit Fabrication, IEEE Circuits and Devices Magazine, 3(4):6-11 (1987).
J.C.C. Fan et al., Graphite-Strip-Heater Zone-Melting Recrystallization of Si Films, J. Crystal Growth 63:453-483(1983).
K. Shigematsu et al., Thermal Properties of Molten Bismuth Germanates, J. Crystal, 137: 509-515 (1994).
K. Kawano et al., Crystal Growth of Bi.sub.4 Ge.sub.3 O.sub.12 and Heat Transfer Analyses of Horizontal Bridgman Techniques, Jpn. J. Appl. Phys., 32:1736-1739 (1993).
Kim Do-Hyun
Wang Jong-Hoe
Hiteshew Felisa
Korea Advanced Institute of Science and Technology
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