Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1987-04-09
1989-02-21
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 1, G01B 1100
Patent
active
048060178
ABSTRACT:
An apparatus for the contactless measurement of geometrical dimensions includes a light source emitting a light beam, a first deflector deflecting the light beam at an angle toward an object to be measured, a receiver receiving the light beam and a second deflector for deflecting the light beam reflected by the object toward the receiver. The second deflector rotates about an axis extending perpendicularly to the light beam reflected by the object. The axis of the light beam emitted by the light source extends parallel to the axis of rotation of the second deflector. The light beam conducted to the receiver extends coaxially to the axis or rotation of the second deflector. This apparatus requires no calibration, but only an adjustment. For measuring a distance it is sufficient if only the second deflector rotates. If both deflectors rotate, the second deflector must rotate at a substantially higher rate of rotation than the first deflector. The first deflector is vertically adjustable and lockable. Also, the unit formed by the light source, the two deflectors and the receiver may be rotatable about an axis and movable in longitudinal direction of the axis extending parallel to the axis of rotation of the second deflector.
REFERENCES:
patent: 3588249 (1971-06-01), Studebaker
patent: 4063283 (1977-12-01), Rider
Guse Kuno
Sebastian Lothar
Bochumer Eisenhutte Heintzmann GmbH & Co. KG
Rosenberger Richard A.
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