Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-11-29
2005-11-29
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090, C324S1540PB
Reexamination Certificate
active
06970006
ABSTRACT:
The apparatus enables the automated testing, calibration and characterization of test adapters for semiconductor devices. A holder for the test adapter can be rotated in a defined manner. At least one probe head is provided which can be adjusted radially with respect to the holder. The probe head has two or more contact pins whose spacing distance is adjustable.
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Appen Stephan
Hübner Michael
Kund Michael
Greenberg Laurence A.
Infineon - Technologies AG
Locher Ralph E.
Patel Paresh
Stemer Werner H.
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