Apparatus for testing timing parameters of high speed integrated

Details Apparatus for testing timing parameters of high speed integrated Apparatus for testing timing parameters of high speed integrated

1993-08-20

1994-06-28

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

G01R 3100

Patent

active

053250532

ABSTRACT:
Apparatus for testing input and output parameters for high speed integrated circuit devices. An integrated circuit tester generates a receive clock and a transmit clock using a pair of pre-selected output pins. The integrated circuit tester adjusts the phase relation between the transmit clock and the receive clock. Special circuitry within the device under test compares input and output data to detect errors.

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patent: 4929888 (1990-05-01), Yoshida
patent: 5083299 (1992-01-01), Schwanke et al.

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