Apparatus for testing thin layers of bubble domain material for

Details Apparatus for testing thin layers of bubble domain material for Apparatus for testing thin layers of bubble domain material for

1975-05-08

1976-10-19

Corcoran, Robert J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

340174TC, G01R 3312

Patent

active

039873633

ABSTRACT:
A device for testing magnetic thin layers for defects, in particular "bubble" films in which a magnetic medium in which a recurring pattern of elongate areas magnetized alternately in opposite senses is recorded is moved relative to the layer while the layer is opposite the magnetic medium so that a corresponding pattern of mutually parallel strip-shaped "bubble" domains is formed in the film. Deviations in said pattern are an indication of defects in the film.

REFERENCES:
patent: 3893023 (1975-07-01), Otala
Kurtzig et al., A New Direct Measurement etc., IEEE Trans. on Mag., vol. Mag-4, No. 3, Sept. 1968, pp. 426-430.
Shumate, Jr., Operational Method etc., Jour. of App. Phy. (JAP), vol. 42, Mar. 1-15, 1971, pp. 1274-1275.
Shumate, Jr., Magnetooptic-Measurement, IEEE Trans. on Magnetics (IEEE), Sept. 1971, pp. 586-590.
Argyle, Staining Defects, IBM Tech. Bull., vol. 15, No. 11, Apr. 1973, pp. 3582-3583.
Argyle et al., Dynamic Bubble Array, AIP Conference Proc., No. 10, Part I, 1972, Amer. Inst. of Phys., N.Y., 1973, pp. 403-407.
Akselrad, A. Detection of Mag. Imperfections, AIP Conf. Proc., No. 10, Part I, 1972, Amer. Inst. of Phys. N.Y., 1973, pp. 408-412.

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