Electricity: measuring and testing – Determining nonelectric properties by measuring electric... – Erosion
Patent
1979-02-15
1981-03-10
Dixon, Harold A.
Electricity: measuring and testing
Determining nonelectric properties by measuring electric...
Erosion
324 65R, 324 65P, 324 71R, 324158P, G01R 2702, G01N 2700
Patent
active
042557038
ABSTRACT:
An apparatus for testing the size and the spacings of silicon crystals in Al-Si alloys comprises a housing; a horizontal guide accommodated in the housing, and a pointed scanning needle secured by a spring device to the horizontal guide with constant feed. The needle is arranged to scan a surface of a workpiece to be tested with a predetermined force and has applied thereto an electrical voltage which upon contacting an aluminum section of the workpiece transmits a voltage applied to the workpiece to a voltmeter, but partially or entirely interrupts same upon contacting a silicon crystal.
REFERENCES:
patent: 2942248 (1960-06-01), Huggins
patent: 3225296 (1965-12-01), Roth
patent: 3247454 (1966-04-01), Gale et al.
Test Probe With Variable Ground & Constant Impedance Capabilities, M. R. asch & M. F. McAllister, IBM Technical Disclosure Bulletin, vol. 18, No. 3, Aug. 1975, pp. 699 & 700.
Orbiting Probe: IBM Technical Disclosure Bulletin, vol. 13, No. 7, Dec. 1970, pp. 2113 & 2114, J. W. Wagner & P. M. Young.
Electrical Probe, IBM Technical Disclosure Bulletin, vol. 8, No. 12, May 1966, F. L. Graner & W. Kunzelman, pp. 1722 & 1723.
Dixon Harold A.
Fraunhofer-Gesellschaft zur Forderung der ange-wandten Forschung
Smith, Jr. John C.
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