Apparatus for testing signal timing and programming delay

Details Apparatus for testing signal timing and programming delay Apparatus for testing signal timing and programming delay

1996-05-09

1998-11-24

Nguyen, Hoa T.

Excavating

371 211, 327276, G01R 3128, G11C 2900

Patent

active

058417893

ABSTRACT:
A method and apparatus for testing and programming signal timing are disclosed which can be incorporated into an integrated circuit device utilizing on-chip timed command signals and pulses. The method of the invention enables nonpermanent testing and retesting of a device at various operational speeds during production testing. During retesting, temporary signal delays are selectively introduced into the circuit of a device which failed a previous test due to non-repairable errors. Once a device passes the production test error-free or with repairable errors, the temporary signal delays are permanently programmed into the device. Specifically, the method utilizes one or a plurality of mode control circuits and test voltage input terminals to nonpermanently select signal delays which may be identified and permanently enabled at a later time.

REFERENCES:
patent: 5361230 (1994-11-01), Ikeda et al.

Affiliated with

Also associated with

Rating

Apparatus for testing signal timing and programming delay does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for testing signal timing and programming delay, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for testing signal timing and programming delay will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1711245