Apparatus for testing semiconductor IC (integrated circuit)

Details Apparatus for testing semiconductor IC (integrated circuit) Apparatus for testing semiconductor IC (integrated circuit)

1997-09-09

1999-09-14

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324769, G01R 3126

Patent

active

059528443

ABSTRACT:
An apparatus for testing a semiconductor IC, comprises electronic circuits in a number corresponding to the number of terminals of a memory to be tested. The electronic circuits each comprise a set of a waveform generator, a strobing pulse generator, and a logic comparator, the electronic circuit being a CMOS type LSI, wherein logic operation circuits in a semiconductor chip constituting a LSI and thermal control circuits are paired. The power consumption of the thermal control circuits is regulated by the output operation frequency of each of the logic operation circuits, the sum of the heating value of each of the logic operation circuits and the heating value of the thermal control circuits paired with the logic operation circuits are made constant, permitting timing accuracy to be stabilized independently of test frequency and test pattern.

REFERENCES:
patent: 5270643 (1993-12-01), Richardson et al.
patent: 5473259 (1995-12-01), Takeda
patent: 5493208 (1996-02-01), Goto

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