Apparatus for testing semiconductor devices using a conductive s

Details Apparatus for testing semiconductor devices using a conductive s Apparatus for testing semiconductor devices using a conductive s

1994-04-05

1995-08-22

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 725, 437 8, 29825, 439482, 333246, G01R 3100, G01R 3102

Patent

active

054443881

ABSTRACT:
A semiconductor apparatus for functionally inspecting semiconductor devices is designed to prevent contact failure, deformation, and the like caused by solder transferred from external leads of semiconductor devices and deposited on contact terminals of the inspection apparatus. A sheet having metal-film patterns corresponding to an array of external leads of a semiconductor device is interposed between the external leads and the contact terminals to electrically connect the external leads to the contact terminals. The semiconductor device is inspected and the sheet is changed at a suitable time when it is contaminated with solder.

REFERENCES:
patent: 4987365 (1991-01-01), Shreeve et al.
patent: 5313157 (1994-05-01), Pasieczuik et al.

Affiliated with

Also associated with

Rating

Apparatus for testing semiconductor devices using a conductive s does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for testing semiconductor devices using a conductive s, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for testing semiconductor devices using a conductive s will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2144525