Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1981-05-04
1984-02-28
Krawczewicz, Stanley T.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324 51, G01R 3102
Patent
active
044344015
ABSTRACT:
An apparatus is provided for testing semiconductor devices. The apparatus tests the impedance of the semiconductor devices in both conducting and non-conducting states to detect semiconductors whose impedance in the conducting state is too high or whose impedance in the non-conducting state is too low. The apparatus uses a battery source for low voltage d.c. The circuitry for detecting when the impedance is too high in the conducting state includes a lamp in series with the battery source and the semiconductor device, whereby the impedance of the semiconductor device determines whether sufficient current will flow through the lamp to cause the lamp to illuminate. A d.c. to d.c. converter is provided to boost the voltage from the battery source to a relatively high voltage d.c. The relatively high voltage d.c. can be connected by a switch to circuitry for detecting when the impedance of the semiconductor device in the non-conducting state is too low. The circuitry for detecting when the impedance of the semiconductor device is too low includes a resistor which senses the current flowing in the device and converts the current into a voltage proportional to the leakage current. This voltage is then compared against a fixed reference. Further circuitry is provided for providing a visual indication when the voltage representative of leakage in relation to the reference signal indicates that there is excessive current flow through the semiconductor device.
REFERENCES:
patent: 3193766 (1965-07-01), Fleming
patent: 3206675 (1965-09-01), Brunetto
patent: 3277371 (1966-10-01), Marcus et al.
patent: 3478264 (1969-11-01), Tsergas
patent: 3914690 (1975-10-01), Shelnutt
patent: 4031465 (1977-06-01), Sterner
Carlson: "Semiconductor Circuit Tester . . . "-Radio Electronics-vol. 36-No. 4-Apr. 1965, p. 70.
Phillips Catalogue: "Test and Measuring Instruments"-1971-pp. 139-141.
International Rectifier News: "Testing Controlled Rectifiers", part 2, 1966.
Flight Systems, Inc.
Krawczewicz Stanley T.
Solis Jose M.
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