Apparatus for testing semiconductor devices

Details Apparatus for testing semiconductor devices Apparatus for testing semiconductor devices

1987-04-02

1989-02-21

Smith, Jerry

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158F, G01R 3126, G01R 104

Patent

active

048068578

ABSTRACT:
An apparatus for testing a semiconductor device including a dielectric package and a lead with respect to the breakdown voltage thereof against electrostatic charges stored on the dielectric package. The apparatus includes a charger having a metal plate connected to an output terminal of a DC power source for charging the dielectric package by bringing the metal plate into contact with the surface of the package when voltage is supplied from the DC power source thereto; a first discharger has a metal bar connected to a ground potential is provided for discharging charges on the package by selectively bringing the metal bar into contact with the leads subsequent to the charging of the package, and a second discharger having a terminal connected to the ground potential is provided for discharging the charges remaining in a circuit of the semiconductor device by bringing the terminal into contact with the lead after stopping the supply of the voltage from the DC power source subsequent to the discharging by the first discharger.

REFERENCES:
patent: 4636724 (1987-01-01), Fukuda et al.
patent: 4677375 (1987-06-01), Nakaie et al.

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