Apparatus for testing processing electronics

Details Apparatus for testing processing electronics Apparatus for testing processing electronics

2007-04-03

2007-04-03

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

Reexamination Certificate

active

11191999

ABSTRACT:
An apparatus is disclosed for testing the processing electronics of a detector module for an X-ray computer tomograph. To provide a measurement environment which is as noise-free as possible, the processing electronics to be tested are tested when they are DC decoupled from a current source and a measurement and tapping apparatus.

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IEEE Std 301-1988: “IEEE Standard Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors for Ionizing Radiation”, 1989.

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