Apparatus for testing molten metal

Measuring and testing – Measuring vessel

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73DIG9, G01N 112

Patent

active

040032612

ABSTRACT:
A measuring or sampling probe is to be lowered to a desired depth in molten metal. The probe is mounted on a tiltable elongate probe-carrier which can be lowered and raised. The probe-carrier is telescopic, its length being adjustable between given limits.

REFERENCES:
patent: 3638500 (1972-02-01), Wetzel et al.
patent: 3916693 (1975-11-01), Hancart et al.

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