Apparatus for testing molten metal

Measuring and testing – Measuring vessel

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Details

331264R, 734254R, 73DIG9, 116109, 116118R, G01F 2300, G01N 110

Patent

active

040032604

ABSTRACT:
A measuring or sampling probe is to be lowered to a desired depth in a molten metal. The probe is mounted on a probe carrier which can be lowered and raised. A contact detector, which emits a control signal when the detector comes into contact with the upper surface of the molten metal, is fixed on the probe carrier at a distance above the probe.

REFERENCES:
patent: 2620815 (1952-12-01), Margraf et al.
patent: 3153345 (1964-10-01), Berg
patent: 3313159 (1967-04-01), Vanderbeck
patent: 3559452 (1971-02-01), Perbix et al.
patent: 3577886 (1971-05-01), Wiese
patent: 3724276 (1973-04-01), Schwind
patent: 3853009 (1974-12-01), Sutherland

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