Apparatus for testing integrated circuits

Details Apparatus for testing integrated circuits Apparatus for testing integrated circuits

1995-04-24

1996-07-16

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 1073

Patent

active

055370519

ABSTRACT:
A method and apparatus for testing integrated circuits by connecting a plurality of leads (25) of a device (10) to a test board (50). The test fixture (32) includes a test plate (70) having a plurality of test points (74) corresponding to the leads (25) of the device (10) and an alignment plate (60). The test points (74) are electrically connected to the test board (50) by a series of runners (76) extending from the test points (74) on the test plate (70) to a series of bumped finger pads (72) on the test plate (70). The bumped finger pads (72) of the test plate (70) are electrically connected to a series of bumped finger pads (54) on an active side (52) of the test board (50). The test plate (70) is fabricated of flex material. The alignment plate (60) is fabricated of flex material and is mounted on top of the test plate (70), so that the alignment plate (60) covers the runners (76), electrically insulating the runners (76). The alignment plate (60) includes a series of perforations (62) corresponding to the test points (74), such that the leads (25) of the device (10) fit securely into the perforations (62) and contact the test points (74). The method comprises inserting the device (10) onto the test fixture (32); aligning the leads (25) of the device (10) onto corresponding test points (74) of the test fixture (32), so that each test point (74) contacts a corresponding lead (25); and testing the device (10).

REFERENCES:
patent: 4209745 (1980-06-01), Hines
patent: 4322682 (1982-03-01), Schadwill
patent: 4496903 (1985-01-01), Paulinski
patent: 4573009 (1986-02-01), Fowler et al.
patent: 4667155 (1987-05-01), Coiner et al.
patent: 4700132 (1987-10-01), Yarbrough et al.
patent: 4771234 (1988-09-01), Cook et al.
patent: 4935695 (1990-06-01), Hayes et al.
patent: 4977370 (1990-12-01), Andrews
patent: 5015946 (1991-05-01), Janko

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