Apparatus for testing IC elements

Details Apparatus for testing IC elements Apparatus for testing IC elements

1991-07-11

1992-09-29

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158F, G01R 3100

Patent

active

051516519

ABSTRACT:
An apparatus for testing IC elements each having an upper mold and leads includes a holding section for holding the IC elements, a contact section having contact to be contacted with the leads of the IC elements and a supporting member for supporting the probes, a lift mechanism for causing the holding section and the contact section to approach each other and contact them each other, and a mold guide provided adjacent the supporting member and movable toward it. The mold guide includes an edge portion formed with grooves for receiving the probes, and a bottom face and inner faces for aligning the IC elements with the mold guide.

REFERENCES:
patent: 4719417 (1988-01-01), Evans
patent: 4987365 (1991-01-01), Shreeve et al.
patent: 4996476 (1991-02-01), Balyasny et al.
patent: 5049813 (1991-09-01), Van Loan et al.

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