Apparatus for testing IC devices at low temperature and cooling

Details Apparatus for testing IC devices at low temperature and cooling Apparatus for testing IC devices at low temperature and cooling

1988-12-15

1990-04-24

Capossela, Ronald C.

Refrigeration

Storage of solidified or liquified gas

Including cryostat

62383, 174 151, F25B 1900

Patent

active

049189280

ABSTRACT:
An apparatus for testing IC devices for performance at a low temperature comprises a cooling disk disposed within a test chamber and adapted to be cooled with liquid nitrogen of like refrigerant for cooling the IC device in contact or proximity therewith. A cooling bag for use as cooling means in testing IC devices at a low temperature comprises a bag adapted to intimately contact the IC device and having a refrigerant enclosed therein. Another apparatus for testing IC devices at a low temperature comprises a cooling bag reeved around a drive roller and an idler roller in the form of a belt conveyor and adapted to come into intimate contact from above with IC devices being transported on a conveyor to cool the devices.

REFERENCES:
patent: 3611745 (1971-10-01), Schlemmer
patent: 3705500 (1972-12-01), Jehle
patent: 4261183 (1981-04-01), Plomp

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