Excavating
Patent
1993-12-22
1995-07-04
Voeltz, Emanuel T.
Excavating
371 27, G01R 3128
Patent
active
054307376
ABSTRACT:
An apparatus for testing the function of an IC that has a discrimination circuit for discriminating the result of a function test regardless of a change in the output timing of output data from an IC being tested. The discrimination circuit makes a nondefective determination if a discrimination time range from a starting point, a time from the transmission by a first timing generating circuit, to an end point, a time from a transmission by a second timing/generating circuit, includes a time region in which the output data from the IC and predicted data of an IC tester coincide with each other. A function test applying a high power supply voltage Vcc to the IC and a function test applying a low voltage Vcc can respectively be correctly performed to determine whether the subject IC is nondefective while eliminating the necessity of changing the timing data of the first and second timing generating circuits.
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Omura Ryuuji
Yamashita Eisaku
Assouad Patrick J.
Mitsubishi Denki & Kabushiki Kaisha
Voeltz Emanuel T.
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