Apparatus for testing electronic devices having a high density a

Details Apparatus for testing electronic devices having a high density a Apparatus for testing electronic devices having a high density a

1976-02-17

1977-08-30

Rolinec, Rudolph V.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

339 75M, G01R 3126, G01R 3102

Patent

active

040457354

ABSTRACT:
Apparatus for testing electronic devices having a high density array of pin leads includes a zero insertion force socket having coaxial output leads with the inner conductor being a conductor pair with the coaxial lead terminating at a number of test heads. Each test head includes switching means for terminating the output coaxial lead in a characteristic impedance. The various test heads are then coaxially coupled, maintaining the two conductor inner lead pair, to more distant signal sources and receivers of both the ac and dc types to provide for Kelvin testing by separately connecting the inner conductor pair to power and sense devices or shorting the conductor pair together and conducting ac testing by use of pulsers and discriminators, or other dynamic test sources or sense devices such as sinewave devices.

REFERENCES:
patent: 3911361 (1975-10-01), Bove et al.
patent: 3963986 (1976-06-01), Morton et al.

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