Apparatus for testing electronic devices

Details Apparatus for testing electronic devices Apparatus for testing electronic devices

2006-09-14

2010-11-02

Wachsman, Hal D (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S116000, C702S118000, C702S188000

Reexamination Certificate

active

07826995

ABSTRACT:
The invention provides an apparatus for testing an integrated circuits on devices including a plurality of electrical subassemblies including a plurality of pattern generator, driver, and power boards divided into physical zones with each physical zone including one pattern generator board, at least one driver board, and at least one power board connected to one another; and a configuration file having information representing flow of current through the electrical subassemblies connected to one another in an interconnection scheme, wherein the electrical subassemblies are organized into at least one logical zone, and wherein the logical zone comprises a plurality of pattern generators.

REFERENCES:
patent: 2005/0273685 (2005-12-01), Sachdev et al.

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