Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1987-06-05
1988-02-09
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Plural, automatically sequential tests
324158F, 324158P, G01R 1512
Patent
active
047243775
DESCRIPTION:
DESCRIPTION
The universal testing apparatus represented in FIG. 1 is arranged on a frame 1 which carries an oblique table 2. On the top surface of the table there is a cartridge 4 for the printed circuit boards 22 to be tested. The printed circuit boards 22 are pushed in cycles out of a cartridge 4 by means of a slide. A pneumatic cylinder 6 serves to actuate the slide.
A testing part 7 is connected to the cartridge 4. The testing part 7 has a display window 10 for any faults located. Furthermore, the testing part 7 is provided with a keyboard 11 in order to input the individual operating functions. The testing part can be swivelled upwards by means of a handle 12 about a swivelling axis (not visible in FIG. 1) in parallel with the oblique table plane 3.
The printed circuit boards which have been tested slide as a result of the force of gravity on the oblique table plane 3 into a sorting part 8. The test result of the testing part 7 is communicated to the control of the sorting part 8, with the result that the sorting part 8 sorts the printed circuit boards into those having undesired printed conductor connections, into those having undesired printed conductor interruptions, and into those which are good. The stack of good printed circuit boards 22 is recognizable in the sorting part 8.
According to FIG. 2 the testing part 7 consists of a bottom part 15 and of a top part 16 which are joined by a hinged joint 18. The top part 16 can, as already mentioned in connection with FIG. 1, be swivelled up by lifting the handle 12. The bottom part 15 and the top part 16 can be locked toward by means of a lock 29.
A supporting part 17 is secured to the top part 16 by a further hinged connection 52. The supporting part 17 can be swivelled up about the hinged connection 52 relative to the top part 16. The supporting part 17 can also be locked with the top part 16 by means of a lock 14.
Inside the bottom part 15 there is a supporting plate 21 for the printed circuit board 2 to be tested. The supporting plate 21 can be raised and lowered respectively by means of three lifting cylinders 20. The three lifting cylinders 20 are supplied with pressure fluid or compressed gas from a fluid source via a line 35. In the lowered position the surface of the supporting plate 21 is aligned with the table plate surface 3 in FIG. 1. The direction of transport runs perpendicularly to the plane of the drawing. The carrier plate 23 laying on the supporting plate 21 is confined laterally by guides 25 during transportation.
Above the printed circuit board 22 to be tested, of which the holes are arranged here in the standard grid dimension, there is in the top part 16 a perforated grid plate 24 with guide holes 36 likewise arranged in the standard grid (see FIG. 4). There are placed on the surface of the perforated grid plate 24 modules 27 which are provided on their lower faces with test pins 26 which engage through the guide holes 36 in the perforated grid plate 24. Above the printed circuit board 22 to be tested there is a foil 23 with holes 39 (see FIG. 4) which allow only those test pins 26 which are to encounter test points on the printed circuit board to penetrate onto the printed circuit board 22. The foil 23, which consists of insulating material, is secured in the direction of transport before the printed circuit board to be tested on the underside of the perforated grid plate 24 (not shown) and remains permanently in the apparatus. If a new type of printed circuit board is to be tested, the foil must be changed. The foil has the task of preventing test pins which are not intended for chosen test points on the printed circuit board from striking between two adjacent printed conductors and possibly producing a short circuit. Furthermore, the foil should ensure that the printed circuit board to be tested is spared mechanically by striking only that number of test pins which is absolutely necessary.
Test pins also strike the lateral guides 25, as the partial grid field defined by the test pins of all the modules is usually larger than the printed c
REFERENCES:
patent: 3654585 (1972-04-01), Wickersham
patent: 4164704 (1979-08-01), Kato et al.
patent: 4417204 (1983-11-01), Dehmel et al.
Dehmel Rudiger
Higgen Hans H.
Luther Erich
Maelzer Martin
Eisenzopf Reinhard J.
Nguyen Vinh P.
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