Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1976-06-07
1978-06-27
Corbin, John K.
Electricity: measuring and testing
Plural, automatically sequential tests
235302, G01R 1512, G06F 1100
Patent
active
040977978
ABSTRACT:
A system is described for testing electrical circuit units, particularly printed circuit cards having a plurality of plug-in connector terminals.
The testing system is first operated in the Generation Mode wherein it generates a reference test pattern produced from a series of test stimuli applied sequentially to a reference card, and stores the pattern in a bulk memory, the pattern being in the form of a series of words identified by the part number of the respective card and containing the test stimuli and the responses thereto from the reference card. To test a production card, the system is operated in the Test Mode, wherein the stored test pattern generated from the corresponding reference card is extracted from the bulk memory and the reference responses are compared in a GO, NO-GO testing operation with the actual responses produced when applying the same test stimuli to the production card.
The system includes a pair of flip-flops for each pin of the tested card, one flip-flop being connected to a circuit which reflects the actual response of the pin to the test stimulus during the Test Mode, and the other flip-flop being connected to a circuit which reflects the reference reponse to the test stimulus as determined during the Generation Mode. The flip-flop pairs are disposed in a plurality of matrix cards each accommodating all the flip-flops of a group of pins (e.g., eight matrix cards each containing the flip-flop pairs for 25 pins, when testing a 200-pin card), providing a flexible modular arrangement easily enlargeable or alterable for testing other cards.
REFERENCES:
patent: 3302109 (1967-01-01), Jones
patent: 3581074 (1971-05-01), Waltz
patent: 3614608 (1971-10-01), Giedd
patent: 3651315 (1972-03-01), Collins
patent: 3673397 (1972-06-01), Schaefer
N. J. Gale, "A Computer Controlled Circuit Tester" Electronic Instrumentation Conference, Hobart, Australia, May 1972, pp. 80-82.
Krosner; S. P. et al., "Logic Card Tester" IBM Technical Disclosure Bulletin, vol. 14, No. 4, Sep. 1971, pp. 142-143.
Cargile; W. P., "A Computer--Controlled System for Testing Digital Logic Modules" Hewlett--Packard Journal, Mar. 1969, pp. 14-20.
Barish Benjamin J.
Burroughs Corporation
Corbin John K.
Gaudier Dale V.
Hille Rolf
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