Apparatus for testing digital and analog circuits

Details Apparatus for testing digital and analog circuits Apparatus for testing digital and analog circuits

1982-03-22

1984-04-03

Atkinson, Charles E.

Excavating

324 73R, 371 20, G06F 3128

Patent

active

044411839

ABSTRACT:
A high-speed, high-resolution testing circuit for both analog and digital circuit packs is described. The testing circuit, which employs data compression techniques, comprises a shift register (22) having an overall length selectively variable under program control, and an arrangement (18) for combining incoming data signals with feedback signals out of predetermined stages of the shift register. The positions of the feedback taps of the variable length shift register are selectively variable under program control (24,26).

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Neil, Designing a Serviceman's Needs Into Microprocessor-Based Systems, Electronics, 3/1/79, p. 122.

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