Apparatus for testing devices

Details Apparatus for testing devices Apparatus for testing devices

2007-09-28

2010-11-30

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S760020

Reexamination Certificate

active

07843202

ABSTRACT:
Methods and apparatus for testing semiconductor devices are provided herein. In some embodiments, an assembly for testing semiconductor devices can include a probe card assembly; and a thermal barrier disposed proximate an upper surface of the probe card assembly, the thermal barrier can restrict thermal transfer between tester side boundary conditions and portions of the probe card assembly disposed beneath the thermal barrier.

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International Search Report and Written Opinion mailed Apr. 6, 2009 for PCT Application No. PCT/US2008/078036.
Int'l Preliminary Report On Patentability, PCT Application No. US2008/078036 (Mar. 30, 2010), 5 pages.

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