Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2010-11-10
2011-12-13
Jarrett, Ryan (Department: 2121)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C356S430000, C356S431000, C156S234000, C156S264000, C083S073000, C083S886000, C083S676000, C702S081000, C702S001000
Reexamination Certificate
active
08078307
ABSTRACT:
A defect testing apparatus for testing defects of optical film sheet-shaped product of an optical displaying apparatus, which includes a defect detecting means for detecting defects of a monolayer body and/or a laminate body constituting the sheet-shaped product in a state in which a protective layer on a surface of the sheet-shaped product is not disposed and defect information preparing means for preparing defect information which is information related to the defects detected by the defect detecting means, and the defect information is used for producing the sheet-shaped product provided in a roll form or in separate sheets.
REFERENCES:
patent: 3202043 (1965-08-01), Galey et al.
patent: 3652863 (1972-03-01), Gaskell et al.
patent: 5450201 (1995-09-01), Katzir et al.
patent: 5459576 (1995-10-01), Brunfeld et al.
patent: 6650410 (2003-11-01), Shimoda
patent: 7079245 (2006-07-01), Kurata et al.
patent: 7641837 (2010-01-01), Takiyama et al.
patent: 2002/0154308 (2002-10-01), Uesugi et al.
patent: 2003/0031848 (2003-02-01), Sawada et al.
patent: 2003/0184722 (2003-10-01), Kyusho
patent: 2004/0095526 (2004-05-01), Yamabuchi et al.
patent: 2004/0179178 (2004-09-01), Emoto
patent: 2006/0037693 (2006-02-01), Wade
patent: 2006/0164647 (2006-07-01), Shibata
patent: 2006/0203246 (2006-09-01), Nakajima et al.
patent: 2008/0088790 (2008-04-01), Ohashi
patent: 2009/0280411 (2009-11-01), Ohira et al.
patent: 1526930 (1978-10-01), None
patent: 2173294 (1986-10-01), None
patent: 2003-149164 (2003-05-01), None
patent: 2003-202298 (2003-07-01), None
patent: 2005-009919 (2005-01-01), None
patent: 2005-62165 (2005-03-01), None
patent: 2006-292678 (2006-10-01), None
patent: 2005-065367 (2005-07-01), None
European Serach Report dated Dec. 23, 2009, issued in corresponding European Patent Application No. 07117918.
European Search report dated Mar. 1, 2010 issued in corresponding European Patent Application No. 07117918.
Japanese Office Action dated Aug. 18, 2011, issued in corresponding Japanese Patent Application No. 2007-183468.
Chang Sunray
Jarrett Ryan
Nitto Denko Corporation
Westerman Hattori Daniels & Adrian LLP
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