Apparatus for testing counter circuit

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371 204, 371 27, 371 24, 377 29, 377 39, H04B 1700

Patent

active

054794129

ABSTRACT:
In an apparatus for testing a counter circuit, a test pattern is used to drive the counter circuit to obtain an output pattern. The output pattern is compared with an expected pattern in synchronization with the test pattern, thereby determining whether or not the counter circuit is normal. A phase between the output pattern and the expected pattern is initially adjusted by the testing apparatus.

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patent: 5305331 (1994-04-01), Sato et al.
patent: 5337045 (1994-08-01), Shirasaka

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