Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-10-31
2010-02-23
Hollington, Jermele M (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C136S259000
Reexamination Certificate
active
07667479
ABSTRACT:
There is disclosed an apparatus for testing concentration-type solar cells. The apparatus includes a light source for emitting light, a focusing unit for focusing the light emitted from the light source and turning the same into a light beam, a testing unit for testing any one of solar cells of a wafer; and a wafer-positioning unit for moving the wafer horizontally and vertically, thus brining a targeted one of the solar cells into contact with the testing unit.
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Chen Chun-yi
Chen Wen-Fu
Hong Hwen-Fen
Kuo Cherng-Tsong
Kuo Hung-zen
Atomic Energy Council
Hollington Jermele M
Jackson IPG PLLC
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