Apparatus for testing a semiconductor device by comparison with

Details Apparatus for testing a semiconductor device by comparison with Apparatus for testing a semiconductor device by comparison with

1994-11-08

1996-10-29

Nguyen, Vinh P.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

G01R 1512

Patent

active

055700128

ABSTRACT:
A semiconductor device under test (DUT) is checked, particularly for its wirebond integrity, by comparison with an identical reference device which is known good. Each of the DUT and reference device equally has pins. A current is selectively supplied to each pin of the reference device to provide a reference voltage drop at the reference device. Similarly, an identical current is selectively supplied to each pin of the DUT to measure a voltage drop at the DUT. The voltage drop at the DUT is compared with the reference voltage drop to provide a difference. Finally, determination is made as to whether the difference is within a tolerable range.

REFERENCES:
patent: 4055801 (1977-10-01), Pike et al.
patent: 4092589 (1978-05-01), Chau et al.
patent: 4150331 (1979-04-01), Lacher
patent: 4651088 (1987-03-01), Sawada
patent: 4720671 (1988-01-01), Tada et al.
patent: 4774456 (1988-09-01), Miller

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