Apparatus for testing a nonpackaged die

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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324755, G01R 3102

Patent

active

059429089

ABSTRACT:
A fixture is provided for making temporary electrical connections with an integrated circuit die having interconnect pads arranged in a predetermined pattern. The fixture includes contact elements carried by a substantially rigid support member in a pattern corresponding to the predetermined pattern of interconnect pads and adapted to engage a single die. An engagement assembly is provided for bringing the interconnect pads and the contact elements together to make nonpermanent temporary simultaneous electrical connections therebetween. The engagement assembly includes a package having leads in a configuration compatible with test, burn-in and handling equipment for conventional integrated circuit packages.

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