Apparatus for testing a highly-integrated, microprogram-controll

Details Apparatus for testing a highly-integrated, microprogram-controll Apparatus for testing a highly-integrated, microprogram-controll

1983-11-07

1986-08-19

Atkinson, Charles E.

Excavating

364200, G06F 1100, G01R 3128

Patent

active

046073663

ABSTRACT:
An apparatus for testing a highly-integrated microprogram-controlled electronic component in combination with the component, includes a sequencer disposed in the component for forming microprogram sequence links, and a test register disposed in the component having outputs connected to the sequencer for controlling a test, the test register having an input being connectible to a central processing unit and to an external testing device.

REFERENCES:
patent: 4327408 (1982-04-01), Frissell et al.
patent: 4433412 (1984-02-01), Best et al.
patent: 4500993 (1985-02-01), Jacobson

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