Apparatus for testing a device with a high frequency signal

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Details

C324S754090

Reexamination Certificate

active

07627445

ABSTRACT:
The present invention provides an apparatus for testing a device with a high frequency signal, such as an RF signal. The apparatus delivers a high frequency signal directly to a loadboard with a coaxial cable. The coaxial cable can deliver the signal to a location at or near the device on the loadboard. The cable can connect to the loadboard through a threaded connection. The other end of the cable can connect to a testing module or another cable. The apparatus can further comprise a section or housing between the circuit board and the testing module to provide support for the cables and their respective connections. The apparatus can further provide connections for both high frequency testing and low frequency testing.

REFERENCES:
patent: 4045735 (1977-08-01), Worcester et al.
patent: 4707834 (1987-11-01), Frisch et al.
patent: 4731577 (1988-03-01), Logan et al.
patent: 5014002 (1991-05-01), Wiscombe et al.
patent: 5116244 (1992-05-01), Cartier et al.
patent: 5477159 (1995-12-01), Hamling
patent: 5558541 (1996-09-01), Botka et al.
patent: 5846097 (1998-12-01), Marian, Jr.
patent: 5903143 (1999-05-01), Mochizuki et al.
patent: 5944548 (1999-08-01), Saito
patent: 5969535 (1999-10-01), Saito
patent: 6028439 (2000-02-01), Arkin et al.
patent: 6313653 (2001-11-01), Takahashi et al.
patent: 6791317 (2004-09-01), Walsh et al.
patent: 2001/0025957 (2001-10-01), Takahashi
patent: 3524035 (1987-01-01), None
patent: 3524035 (1987-01-01), None
patent: 0 147 135 (1985-07-01), None
patent: 2 195 029 (1988-03-01), None
patent: 2000-048920 (2000-02-01), None
patent: 2000-235061 (2000-08-01), None
Patent Abstracts of Japan, vol. 2000, No. 11, Jan. 3, 2001 and JP 2000-235061 A, published Aug. 29, 2000.
Patent Abstracts of Japan, vol. 2000, No. 5, Sep. 14, 2000 and JP 2000-048920, published Feb. 18, 2000.
Patent abstract of esp@cenet database, German Patent No. DE-3524035 dated Jan. 8, 1987, Applicant: Standard Electrik Lorenz AG.

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