Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Patent
1997-06-23
1998-11-03
Barlow, Jr., John E.
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
364130, 364132, 395309, 395822, 395848, G06F 1300
Patent
active
058324186
ABSTRACT:
An apparatus for testing an IDE controller with random constraints, the apparatus including: an IDE controller module for simulating the IDE controller, wherein the IDE controller includes primary and secondary channels and a host interface; a primary control module, coupled to the host interface, for testing the primary channel; a secondary control module, coupled to the host interface, for testing the secondary channel; and a host request module for arbitrating access to the host interface between the primary and secondary control modules.
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Barlow Jr. John E.
Bui Bryan
Micron Electronics
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