Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Patent
1998-05-05
1999-12-21
Hoff, Marc S.
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
702186, 364130, 364132, 710 28, 710129, 710113, G06F 1300
Patent
active
060061669
ABSTRACT:
An apparatus for testing an IDE controller with random constraints, the apparatus including: an IDE controller module for simulating the IDE controller, wherein the IDE controller includes at least one channel and a host interface; a control module for generating data patterns and for transmitting and receiving the data patterns via the host interface and the at least one channel; a verification module, coupled to the control module, for determining whether received data patterns match expected values; and a device module, coupled to the at least one channel, for receiving the data patterns transmitted from the control module and transmitting the data patterns back to the verification module via the at least one channel.
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Bui Bryan
Hoff Marc S.
Micron Electronics Inc.
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