Apparatus for supporting an eddy current probe used to scan an i

Details Apparatus for supporting an eddy current probe used to scan an i Apparatus for supporting an eddy current probe used to scan an i

1983-04-01

1987-02-17

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Magnetic

Magnetic test structure elements

324237, 324226, 324225, 324239, 74 8921, G01N 2790, F16H 2900

Patent

active

046442740

ABSTRACT:
An invention is disclosed which supports an eddy curent probe at a predetermined distance from a surface to be scanned. In another embodiment, the probe is scanned by rotation about an axis and along an arc of predetermined length and position.

REFERENCES:
patent: 3793545 (1974-02-01), Leiber et al.
patent: 3919628 (1975-11-01), Mandula et al.
patent: 3926053 (1975-12-01), Schurver et al.
patent: 3936723 (1976-02-01), Clary
patent: 4066949 (1978-01-01), Condrac
patent: 4219774 (1980-08-01), Rogel et al.
patent: 4258319 (1981-03-01), Shimada et al.
patent: 4270089 (1981-05-01), Haberlein
patent: 4274054 (1981-06-01), Savidge et al.
patent: 4409549 (1983-10-01), Garner et al.
patent: 4430614 (1984-02-01), Gereg
patent: 4434659 (1984-03-01), Kurtz et al.
patent: 4445089 (1984-04-01), Harrison
patent: 4468620 (1984-08-01), Vaerman

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