Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-11-16
1997-10-14
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324519, 324678, G01R 3112
Patent
active
056776349
ABSTRACT:
A plurality of electrical circuit components having capacitance, e.g. ceramic capacitors, are tested simultaneously in a corresponding plurality of test channels. They are stressed by a variable voltage source that can produce an electrical potential selected from a wide range from low potential to high potential. For example the range of selectable potentials can be 1000 volts with a resolution of 1 volt. The charge current by which a component accumulates a charge is controlled to a selected linear rate by a current controller. Voltage sensors and current sensors measure accumulated charges and leakage current, respectively. The current sensor can be selectively sensitized to a plurality of anticipated leakage current ranges. In addition, the selected potentials can each be applied to the components in a single step or can be applied over time in ramp fashion. A processor can be used for running at least a prescribed test process on components, the processor being operatively coupled to, for controlling and receiving inputs from, the above elements. For example the processor is preferably coupled to the variable voltage source, the current controller, the voltage sensor, the current sensor, and a component discharge circuit, operatively coupled meaning that the processor controls.
REFERENCES:
patent: 3268809 (1966-08-01), Meyer et al.
patent: 3414792 (1968-12-01), Mui et al.
patent: 4697151 (1987-09-01), Butler
patent: 5202640 (1993-04-01), Schaaf et al.
patent: 5510719 (1996-04-01), Yamamoto
Young, "Leakage Testers For Small Capacitors", Electronic Components S0219-0042, pp. 1158-1160, Oct. 23, 1970.
Drummond-Murray, "Electrolytic Capacitor Tester", Wireless World, vol. 83, No. 1497, pp. 47-49, May 1977.
Chang Chia-mu
Chaplik Naom
Cooke Peter A.
Cooke Vernon P.
Ivancic David M.
Do Diep
Electro Scientific Industries Inc.
Karlsen Ernest F.
Tighe Thomas J.
LandOfFree
Apparatus for stress testing capacitive components does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus for stress testing capacitive components, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for stress testing capacitive components will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1557847