Photography – Fluid-treating apparatus – Heating – cooling – or temperature detecting
Reexamination Certificate
2009-09-09
2010-12-07
Perkey, W. B. (Department: 2862)
Photography
Fluid-treating apparatus
Heating, cooling, or temperature detecting
C396S611000
Reexamination Certificate
active
07845868
ABSTRACT:
A semiconductor manufacturing process is provided. First, a wafer with a material layer and an exposed photoresist layer formed thereon is provided, wherein the wafer has a center area and an edge area. Thereafter, the property of the exposed photoresist layer is varied, so as to make a critical dimension of the exposed photoresist layer in the center area different from that of the same in the edge area. After the edge property of the exposed photoresist layer is varied, an etching process is performed to the wafer by using the exposed photoresist layer as a mask, so as to make a patterned material layer having a uniform critical dimension formed on the wafer.
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“2nd Office Action of DE counterpart application”, notified on May 11, 2010, p. 1-7, with English Translation included.
Huang Chun-Yen
Huang Pei-Lin
Wang Yi-Ming
Jianq Chyun IP Office
Nanya Technology Corporation
Perkey W. B.
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