Apparatus for semiconductor manufacturing process

Photography – Fluid-treating apparatus – Heating – cooling – or temperature detecting

Reexamination Certificate

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C396S611000

Reexamination Certificate

active

07845868

ABSTRACT:
A semiconductor manufacturing process is provided. First, a wafer with a material layer and an exposed photoresist layer formed thereon is provided, wherein the wafer has a center area and an edge area. Thereafter, the property of the exposed photoresist layer is varied, so as to make a critical dimension of the exposed photoresist layer in the center area different from that of the same in the edge area. After the edge property of the exposed photoresist layer is varied, an etching process is performed to the wafer by using the exposed photoresist layer as a mask, so as to make a patterned material layer having a uniform critical dimension formed on the wafer.

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“2nd Office Action of DE counterpart application”, notified on May 11, 2010, p. 1-7, with English Translation included.

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