Apparatus for scanning a material for detection of flaws and hav

Details Apparatus for scanning a material for detection of flaws and hav Apparatus for scanning a material for detection of flaws and hav

1983-04-14

1986-06-24

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

73622, 324207, 324226, 324227, 324262, G01N 2782, G01N 2904, G01B 714

Patent

active

045969531

ABSTRACT:
Apparatus for detecting flaws on the circumference of a rounded bar of metal. A circular rotator means held by a support is rotated around the material to be inspected for flaws. The rotator means has a number of probes which are revolved around the circumference of the material to detect flaws when the rotator means is rotated. If and when the material deviates from its axis predetermined through the apparatus while passing therethrough, the deviation is detected and the support is displaced in the same direction and distance as the material so that the probes remain spaced apart from the circumference of the material at a predetermined distance while inspecting the material for flaws.

REFERENCES:
patent: 3746972 (1973-07-01), Mandula, Jr. et al.
patent: 3781663 (1973-12-01), Abarotin et al.
patent: 3919628 (1975-11-01), Mandula et al.
patent: 3955425 (1976-05-01), Corneau

Affiliated with

Also associated with

Rating

Apparatus for scanning a material for detection of flaws and hav does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for scanning a material for detection of flaws and hav, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for scanning a material for detection of flaws and hav will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2086568