Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-07-04
2006-07-04
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07071716
ABSTRACT:
A scan test apparatus having at least an upper layer of conductive and compliant material and may include a lower layer of conductive and compliant material sized to cover the upper and lower surfaces of the printed circuit board to be tested. Electrical current is introduced into the conductive layers which shorts out the circuits on the printed circuit board. An electrical contactor is positioned on either side of the conductive layers on both sides of the printed circuit board. The printed circuit board is passed through the upper and lower conductive layers and the contactors by rollers positioned on each end of the scan test machine. The contactor sends a test signal from the circuit board to measurement electronics. Other embodiments include the shorting matrix to be movable and the printed circuit board being fixed and include non-contact sensors or arrays of electrical contactors.
REFERENCES:
patent: 3629702 (1971-12-01), Henken
patent: 4818933 (1989-04-01), Kerschner et al.
patent: 4836797 (1989-06-01), Riechelmann
patent: 4970461 (1990-11-01), LePage
patent: 5017863 (1991-05-01), Mellitz
patent: 5094584 (1992-03-01), Bullock
patent: 5113133 (1992-05-01), Conti et al.
patent: 5124660 (1992-06-01), Cilingiroglu
patent: 5138266 (1992-08-01), Stearns
patent: 5202623 (1993-04-01), LePage
patent: 5268645 (1993-12-01), Prokoff et al.
patent: 5270643 (1993-12-01), Richardson et al.
patent: 5369431 (1994-11-01), Levy et al.
patent: 5469064 (1995-11-01), Kerschner et al.
patent: 5493236 (1996-02-01), Ishii et al.
patent: 5506510 (1996-04-01), Blumenau
patent: 5508627 (1996-04-01), Patterson
patent: 5517110 (1996-05-01), Soiferman
patent: 5553700 (1996-09-01), Smith et al.
patent: 5587664 (1996-12-01), Banitt et al.
patent: 5729146 (1998-03-01), Swart
patent: 5771144 (1998-06-01), Kim
patent: 5773988 (1998-06-01), Sayre et al.
patent: 6145648 (2000-11-01), Teichman et al.
patent: 6191600 (2001-02-01), Swart
patent: 6268719 (2001-07-01), Swart
patent: 6572396 (2003-06-01), Rathburn
patent: 6788078 (2004-09-01), Swart
patent: 19730516 (1999-01-01), None
patent: 0128107 (1984-12-01), None
patent: 0424270 (1991-04-01), None
patent: 0424270 (1991-04-01), None
patent: 0731360 (1996-09-01), None
patent: 0731360 (1996-09-01), None
patent: 0773445 (1997-05-01), None
patent: 0884596 (1998-12-01), None
patent: 1059538 (2000-12-01), None
patent: 2149130 (1985-06-01), None
patent: 2265224 (1993-09-01), None
patent: 2267970 (1993-12-01), None
patent: 58-27784 (1983-02-01), None
patent: 60-46470 (1985-03-01), None
patent: 61-274278 (1986-12-01), None
patent: 62-285072 (1987-12-01), None
patent: 63-90173 (1988-06-01), None
patent: 63-157675 (1988-10-01), None
patent: 2-2946 (1990-01-01), None
patent: 2-13862 (1990-01-01), None
patent: 2-130483 (1990-05-01), None
patent: 3-152481 (1991-06-01), None
patent: 3-206983 (1991-09-01), None
patent: 4-259862 (1992-09-01), None
patent: 4-46217 (1992-10-01), None
patent: 4-127576 (1992-11-01), None
patent: 5-273305 (1993-10-01), None
patent: 6-11498 (1994-03-01), None
patent: 7-83954 (1995-03-01), None
patent: 7-92227 (1995-04-01), None
patent: 7-151834 (1995-06-01), None
patent: 8-15361 (1996-01-01), None
patent: 8-189939 (1996-07-01), None
patent: WO 96/26446 (1996-08-01), None
Degroat, P.M. et al., “Finding Shorts in Printed Circuit Boards,” IBM Technical Disclosure Bulletin, vol. 12, No. 5, Oct. 1969, pp. 655-656.
Japanese Patent Abstract: Publication No. 02-259478, Publication Date Oct. 22, 1990; 2 pages.
Christie Parker & Hale LLP
Delaware Capital Formation Inc.
Hollington Jermele
Nguyen Trung Q.
LandOfFree
Apparatus for scan testing printed circuit boards does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus for scan testing printed circuit boards, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for scan testing printed circuit boards will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3587451