Apparatus for recognizing working height of device transfer...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Reexamination Certificate

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C324S758010

Reexamination Certificate

active

06870360

ABSTRACT:
An apparatus and method are provided for recognizing a working height of a device transfer system in a semiconductor device test handler which allows the working height of the device transfer system to be quickly measured and/or precisely reset. The device transfer system moves horizontally and vertically on a handler body of the semiconductor device test handler, and moves horizontally and vertically, and includes a plurality of pickers which pick up the semiconductor devices. An elevating block installed at one side of the device transfer system moves upward and downward, and a touch probe installed vertical relative to the elevating block moves upward and downward based on contact with a target object. A detector detects ascendance of the touch probe upon contact with the target object, and a working position is determined based on an initial position, a measured position, and a series of offset values.

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patent: 5631573 (1997-05-01), Ohno
patent: 5982132 (1999-11-01), Colby
patent: 6346682 (2002-02-01), Kim et al.
patent: 6445203 (2002-09-01), Yamashita et al.
patent: 6518745 (2003-02-01), Kim et al.
patent: 8272453 (1996-10-01), None

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