Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1998-06-01
1999-11-30
Kim, Robert H.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356349, G01B 902
Patent
active
059952237
ABSTRACT:
The apparatus performs phase imaging interferometry on a test medium with spatially varying optical length. The apparatus uses a polarization based phase shift element in either the probe or reference arm of the interferometer to simultaneously generate both the conventional in-phase spatial interferogram of the test medium, and a quadrature interferogram which is ninety degrees out of phase with the conventional interferogram at all image positions, allowing a reconstruction of the test medium's interferometric phase image over 0 to 2.pi. radians. In contrast to the prior art, the present invention accomplishes the phase shifting operation in a single interferometer stage, using a polarizing beam splitter which accomplishes polarized seggregation of the interferometer output beam. The apparatus has high resistance to vibrations, instability and misalignment errors.
REFERENCES:
patent: 5365065 (1994-11-01), Power
patent: 5619325 (1997-04-01), Yoshida
R. Smythe / R. Moore, Instantaneous phase measuring interferometry Optical Engineering 23(4), 361-364, Jul., 1984.
D.-C. Su, L. -H. Shyu "A new type of polarization phase shifter for phase shifting interferometry" Optik 90, No. 2 (1992) 53-56, May 6, 1991.
Kim Robert H.
Martineau F.
LandOfFree
Apparatus for rapid phase imaging interferometry and method ther does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus for rapid phase imaging interferometry and method ther, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for rapid phase imaging interferometry and method ther will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1679973